Computer Science ›› 2021, Vol. 48 ›› Issue (1): 301-307.doi: 10.11896/jsjkx.200900051

• Information Security • Previous Articles     Next Articles

Mutation Based Fault Localization Technique for BPEL Programs

SUN Chang-ai, ZHANG Shou-feng, ZHU Wei-zhong   

  1. School of Computer and Communication Engineering,University of Science and Technology Beijing,Beijing 100083,China
  • Received:2020-09-04 Revised:2020-10-13 Online:2021-01-15 Published:2021-01-15
  • About author:SUN Chang-ai,born in 1974,Ph.D,professor,Ph.D supervisor,is a senior member of China Computer Federation.His main research interests include software testing,program analysis and service oriented computing.
  • Supported by:
    National Natural Science Foundation of China(61872039) and Fundamental Research Funds for the Central Universities(FRF-GF-19-019B).

Abstract: Unlike traditional C,C++,or Java programs,BPEL (Business Process Execution Language) programs are composed of a set of activities and their interactions,which have the new features such as concurrency,synchronization,and XML-based representation.These new features pose difficulties for effectively locating faults in BPEL programs.To address the limited effectiveness of existing fault localization techniques,we propose a mutation-based BPEL program fault localization technique,design a set of optimization strategies based on characteristics of BPEL programs and their mutation operators,and develop a supporting tool.6 real-life BPEL programs are conducted to evaluate the feasibility and fault localization effectiveness of the proposed technique and its effectiveness is also compared with that of a set of benchmark techniques.Experimental results show that the proposed technique has a higher recall rate while a comparable cost is compared with benchmark techniques,demonstrating that the proposed optimization strategies reduce the mutation cost of the proposed technique.

Key words: BPEL, Fault localization, Mutation analysis, Program debugging, Software testing

CLC Number: 

  • TP311
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