TY - Computer Science A1 - SU Ruo, WU Ji, LIU Chao, YANG Hai-yan T1 - Requirement Defect Detection Based on Multi-view Card Model Y1 - 2018-11-05 JF - Computer Science JO - Computer Science SP - 183 EP - 188 VL - 45 IS - 10 UR - https://www.jsjkx.com N1 - 10.11896/j.issn.1002-137X.2018.10.034 ER -