计算机科学 ›› 2014, Vol. 41 ›› Issue (5): 33-36.doi: 10.11896/j.issn.1002-137X.2014.05.007
涂吉,王子龙,李立健
TU Ji,WANG Zi-long and LI Li-jian
摘要： 提出一种针对内建自测试的测试激励聚类移位压缩方法。对难测故障的测试向量进行聚类压缩,将测试向量划分为若干类,每类内的向量相互之间最多只有一比特相异,从每类中只选取一个种子向量存储到ROM中。为了进一步提高测试向量压缩率,对聚类后的种子向量再进行移位压缩。实验结果表明,聚类移位压缩具有较高的测试数据压缩率,能减少难测向量存储单元,且能以芯片频率进行测试。
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