@article{罗月:118, author = {罗月,童卞,景帅,张蒙,饶永明,闫峰}, title = {基于卷积去噪自编码器的芯片表面弱缺陷检测方法}, publisher = {计算机科学}, year = {2020}, journal = {计算机科学}, volume = {47}, number = {2}, eid = {118}, numpages = {7}, pages = {118}, keywords = {芯片表面缺陷;缺陷检测;深度学习;无监督学习;卷积去噪自编码器}, url = {https://www.jsjkx.com/CN/abstract/article_18877.shtml}, doi = {10.11896/jsjkx.190100141} }