%A WANG Rui, TIAN Yu-li, ZHOU Dong-hong, LI Ning and LI Zhan-huai %T Test-suite Reduction Based on MC/DC in Software Fault Localization %0 Journal Article %D 2015 %J Computer Science %R %P 170-174 %V 42 %N 10 %U {https://www.jsjkx.com/CN/abstract/article_2659.shtml} %8 2018-11-14 %X In the process of software regression testing,frequently modifying software leads to a huge test suite which makes testing more expensive.To address this problem,researches have proposed methods about test suite reduction in consideration of statement/path coverage.However,these methods more or less affect the integrity of MC/DC coverage of the original test suite.We proposed a new approach named MCDCR based on MC/DC coverage rate.Our MCDCR method can guarantee MC/DC coverage while doing no harm to the effectiveness of fault localization and test suite reduction rate.Experiment shows that MCDCR performs better than the existing reduction methods comprehensively.