基于主动学习和U-Net++分割的芯片封装空洞率的研究
齐选龙, 陈弘扬, 赵文兵, 赵地, 高敬阳
Study on BGA Packaging Void Rate Detection Based on Active Learning and U-Net++ Segmentation
QI Xuanlong, CHEN Hongyang, ZHAO Wenbing, ZHAO Di, GAO Jingyang
计算机科学
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2023, (6A): 220200092
-6
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DOI: 10.11896/jsjkx.220200092