计算机科学 ›› 2018, Vol. 45 ›› Issue (6A): 562-567.
倪园慧1,陈巍文1,王磊1,邱柯妮1,2
NI Yuan-hui1,CHEN Wei-wen1,WANG Lei1,QIU Ke-ni1,2
摘要： 多级自旋转移力矩磁性存储器(MLC STT-RAM)是一种新型的非易失性存储介质。不同于采用电荷方式来存储信息的SRAM,MLC STT-RAM利用自旋偏振电流通过磁隧道结(MTJ)改变自由层的磁层方向来存储信息,能够天然地避免电磁干扰。文章利用MLC STT-RAM的抗电磁辐射特性,探索在航天抗辐照环境下将其作为存储介质用于寄存器设计。在MLC STT-RAM中,每个存储单元有4种不同的阻抗状态,不同的阻抗状态之间的转换具有不同的能耗和延迟的代价。而传统的基于SRAM的寄存器分配技术并没有考虑不同的写状态转换的影响,其在没有考虑溢出优先级的情况下启发式地选择潜在溢出变量,因此该方法不适合用在MLC STT-RAM的寄存器分配中。针对该问题,提出了一种面向写状态转换的MLC STT-RAM寄存器分配的溢出优化策略。具体来说,首先,通过每个写状态转换频率的线性组合来构成溢出代价模型。然后,根据溢出代价模型针对性地选择溢出变量,选择代价低的变量保存在寄存器中,而代价高的变量倾向于被溢出,从而便实现了面向MLC STT-RAM的寄存器分配策略的优化设计。
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