Computer Science ›› 2015, Vol. 42 ›› Issue (Z6): 115-117.

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Comparison of Circuit Reliability Calculation Methods Based on PTM Model and BN Model

JIANG Yu-fang and DENG Zuo-xiang   

  • Online:2018-11-14 Published:2018-11-14

Abstract: The development of VLSI technology results in the dramatical improvement of the performance of integrated circuits,and integrated circuits become more susceptible to soft errors.For the reliability of circuits under the soft error,two typical gate-level estimation methods based on the conditinal probability,named PTM method and BN mehod separately,were chosen in this paper.The principles of the two methods were introduced,and the function,applicability and complexity were analyzed respectively by combining the experiemnts.Finally,the results were concluded,and the future research was illuminated.

Key words: BN method,PTM method,Elementary gate,Circuit reliability

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