Computer Science ›› 2019, Vol. 46 ›› Issue (11A): 562-566.

• Interdiscipline & Application • Previous Articles     Next Articles

Application of Open MP and Ring Buffer Technology in Defects Detection of Glass Substrate

HU Hai-bing1, XU Ting1, ZHANG Bo1, XU Dong-jian1, JIN Shi-qun1, LU Rong-sheng2   

  1. (National Engineering Laboratory of Special Display Technology,National Key Laboratory of Advanced Display Technology,Academy of Photoelectric Technology,Hefei University of Technology,Hefei 230009,China)1;
    (School of Instrument Science and Opto-electronics Engineering,Hefei University of Technology,Hefei 230009,China)2
  • Online:2019-11-10 Published:2019-11-20

Abstract: In the process of defect detection of TFT-LCD glass substrates,in order to solve the problems of large data flow,complex data processing flow and high requirement of timing of data input and output,a multi-threaded parallel processing method by using ring buffer and Open MP was proposed.This method uses Open MP technology to realize multi-core parallel processing of complex processing,so as to make full use of the resources of multi-core processors and improve the ability of data processing.At the same time,in the process of defect data input,data processing and data output,multi-threaded parallel processing and real-time stable output can be realized by ring buffer technology.This me-thod was applied to the real-time defect detection system,and the processing speed of the system is increased by 2 to 3 times,the time error of data output is reduced by 70% to 80%,which fully demonstrates the practicability and effectiveness of this method.

Key words: Parallel processing, Defect detection, Open MP, Circular buffer

CLC Number: 

  • TP311.11
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