计算机科学 ›› 2014, Vol. 41 ›› Issue (11): 22-24.doi: 10.11896/j.issn.1002-137X.2014.11.005
程一飞,詹文法
CHENG Yi-fei and ZHAN Wen-fa
摘要: SoC测试面临的挑战之一是测试数据量过大,而测试数据压缩是应对这一挑战行之有效的方法。因此,提出了一种新的双游程交替的测试数据压缩方法,该方法对测试集中0游程和1游程交替编码,并且后一游程类型可以根据前一游程类型转变得到。这样在代码字中不需要表示游程类型,减少了游程所需代码字的长度。实验结果表明, 该方法能够取得比同类方法更高的压缩率,而且解压结构简单,因此能够达到降低测试成本的目标。
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