计算机科学 ›› 2017, Vol. 44 ›› Issue (11): 109-113.doi: 10.11896/j.issn.1002-137X.2017.11.017
郑炜,冯晨,吴潇雪,黄月明,方靓芸
ZHENG Wei, FENG Chen, WU Xiao-xue, HUANG Yue-ming and FANG Jing-yun
摘要： 在并行程序测试中,测试输入和线程交互时序是影响并行错误检测的两个关键因素。以缩减并行错误检测的输入空间为目标,给出一种基于变异测试的测试用例最小化算法。首先对并行程序进行研究,选取与并行错误密切相关的9个变异算子,并以此为基础为待测程序生成多种变异体；采用JPF作为线程调度工具来执行测试用例,根据变异评分与平均时间成本对测试用例进行排序,在优化后的测试用例集中选取检测能力不重复的测试用例,从而得到面向并行错误检测的最小测试用例集。实验结果证明,该方法能有效减小测试用例集的规模,并大幅缩短运行时间,从而提高了并行程序的测试效率。
| [1] MANIKA T.An Approach for Test Case Prioritization Based on Three Factors[J].Information Technology and Computer Scien-ce,2015(4):79-86. [2] GKE N,BELLI F,EMINOV M,et al.Model-based test case prioritization using cluster analysis:a soft-computing approach.http://journals,tubitak.gov.tr/elektrik/abstract.htm?id=16001. [3] OURIQUES J F S,CARTAXO E G,M ACHADO P D L.Revealing influence of model structure and test case profile on the prio-ritization of test cases in the context of model-based testing[J].Journal of Software Engineering Research & Development,2015,3(1):1-28. [4] KAVITHA R,SURESHKUMAR N.Test Case Prioritizationfor Regression Testing based on Severity of Fault[J].International Journal on Computer Science & Engineering,2010,2(5):1462-1466. [5] CHEN T Y,LAU M F.A new heuristic for test suite reduction [J].Information & Software Technology,1998,40(5):347-354. [6] CHEN T Y,LAU M F.A simulation study on some heuristics for test suite reduction[J].Information & Software Technology,1998,40(13):777-787. [7] BRADBURY J S,CORDY J R,DINGEL J.Mutation Operators for Concurrent Java (J2SE 5.0)[C]∥The Workshop on Mutation Analysis.IEEE Computer Society,2006:11. [8] GLIGORIC M,ZHANG L,PEREIRA C,et al.Selective mutation testing for concurrent code[C]∥International Symposium on Software Testing and Analysis.2013:224-234. [9] DAN H,HIERONS R M.Semantic Mutation Analysis of Floa-ting-Point Comparison[C]∥IEEE Fifth International Confe-rence on Software Testing,Verification and Validation.IEEE,2012:290-299. [10] DENG D,ZHANG W,LU S.Efficient concurrency-bug detec-tion across inputs[C]∥Acm Sigplan International Conference on Ojbect Oriented Prgramming Systems Languages & Applications.ACM,2013:785-802. [11] LUCIA B,CEZE L,STRAUSS K.ColorSafe:architectural support for debugging and dynamically avoiding multi-variable atomicity violations[J].ACM Sigarch Computer Architecture News,2010,38(3):222-233. [12] GAO Q,ZHANG W,CHEN Z,et al.2ndStrike:toward manifesting hidden concurrency typestate bugs[J].ACM SIGPLAN Notices,2012,47(4):239-250. [13] MUZAHID A,QI S,TORRELLAS J.Vulcan:Hardware sup-port for detecting sequential consistency violations dynamically[C]∥2012 45th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO).IEEE,2012:363-375. [14] DEMILLO R A,LIPTION R J,SAYWARD F G.Hints on Test Data Selection:Help for the Practicing Programmer[J].Computer,1978,11(4):34-41. [15] HAMLET R G.Testing Programs with the Aid of a Compiler[J].IEEE Transactions on Software Engineering,1977,SE-3(4):279-290. [16] ANDREWS J H,BRIAND L C,Labiche Y.Is mutation an appropriate tool for testing experiments?[C]∥International Conference on Software Engineering,2005(ICSE 2005).IEEE,2005:402-411. [17] ZHONG H,ZHANG L,MEI H.An experimental study of four typical test suite reduction techniques [J].Information & Software Technology,2008,50(6):534-546. |
| No related articles found! |
|
||
首页