关键词: SOC测试 可测性设计 主动测试技术 故障模型 测试向量自动生成

Abstract: The hidden logic flaw and circuit fault are most difficult situation in implementation of ASIC. A comprehensive DFT technique can implement active detection and path tracing in SOC circuit, according to various circuits characteristic. The technique inclu

Key words: SOC test, DFT （Design For Testability）, Active test technique, Fault pattern, ATPG （Automatic Test Pattern Generation）