Computer Science ›› 2006, Vol. 33 ›› Issue (5): 277-281.

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  • Online:2018-11-17 Published:2018-11-17

Abstract: An integrated fault tolerance approach that provides checkpointing, task duplication and DVS (dynamic voltage scaling) for embedded systems is presented in this paper. This paper shows that, by supporting processors' speed adjustment during task execution

Key words: Checkpointing, Task duplication, Double modular redundancy, Dynamic voltage scaling, Store-checkpoint, Compare-checkpoint, Compare-and-store-checkpoint

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