Computer Science ›› 2016, Vol. 43 ›› Issue (5): 9-12.doi: 10.11896/j.issn.1002-137X.2016.05.002

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Reliability Analysis of Circuit under Soft Error

WANG Zhen and JIANG Jian-hui   

  • Online:2018-12-01 Published:2018-12-01

Abstract: With the coming of the big data era,people demand more reliable microprocessor.While the intensive techno-logy scaling make the circuit encounter greater sensitivity to soft errors.It’s very important to analyze the reliability of the circuit under soft errors.This paper gave a survey on the reliability analysis methods,which are categorized into circuit-level,gate-level,register-transfer-level(RTL) and architecture-level,and introduced and compared these methods according to method property in each level.

Key words: Reliability analysis,Circuit level,Gate level,RTL,Architecture level

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