计算机科学 ›› 2015, Vol. 42 ›› Issue (10): 170-174.
王瑞,田宇立,周东红,李 宁,李战怀
WANG Rui, TIAN Yu-li, ZHOU Dong-hong, LI Ning and LI Zhan-huai
摘要: 对不断更新的软件进行回归测试时,持续增加的测试用例会造成累计测试用例数量庞大,进而影响测试成本。在故障定位领域,已有研究在考虑语句覆盖、路径覆盖等的基础上,提出了CMR&PVR等不同的测试用例约简方法。然而,这些方法在一定程度上影响了原始测试用例集的MC/DC(修订的条件/判定)覆盖率。提出一种以MC/DC覆盖为基础的综合测试用例约简方法MCDCR,利用该方法对原始测试用例集约简后,在确保原有故障定位准确性并保持较高约简比的同时,大幅提高了测试用例对程序的MC/DC覆盖率。采用Ochiai方法在Siemens 程序集上进行了实验及验证,结果表明MCDCR约简方法的综合效果明显优于已有的约简方法。
[1] Jones JA,Harrold MJ,Stasko J.Visualization of test information to assist fault localization[C]∥24th International Confe-rence on Software Engineering(ICSE2002).2002:467-477 [2] Wong WE,Debroy V.A survey of software fault localization.Technical report[R].The University of Texas at Dallas,2009 [3] 鞠小林,姜淑娟,张艳梅,等.软件故障定位技术进展[J].计算机科学与探索,2012,6(6):481-494 Ju Xiao-lin,Jiang Shu-juan,Zhang Yan-mei,et al.Advances in fault localization techniques[J].Journal of Frontiers of Compu-ter Science and Technology,2012,6(6):481-494 [4] 陈翔,顾卫江,徐慧,等.回归测试用例选择技术研究综述[J].计算机科学,2013,0(10):1-9 Chen Xiang,Gu Wei-jiang,Xu Hui,et al.Regression Testing Selection Techniques:A State-of-the-art Review[J].Computer Scie-nce,2013,0(10):1-9 [5] Chen Zhen-yu,Xu Bao-wen,Zhang Xiao-fang,et al.A novel approach for test suite reduction based on requirement relation contraction[C]∥23rd ACM symposium on Applied computing (SAC2008).Fortaleza,Ceará,Brazil,2008:390-394 [6] Hao Dan,Xie Tao,Zhang Lu,et al.Test input reduction for result inspection to facilitate fault localization[J].Automated Software Engineering,2010,7:5-31 [7] Yu Yan-bing,Jones J A,Harrold M J.An empirical study of the effects of test suite reduction on fault localization[C]∥Procee-ding of 30th International Conference on Software Engineering (ICSE2008).Leipzig,2008:201-210 [8] Jones J A,Harrold M J.Test-suite reduction and prioritization for modified condition/decision coverage[J].IEEE Transactions of Software Engineering,2003,9(3):195-209 [9] Gong Dan-dan,Wang Tian-tian,Su Xiao-hong,et al.A test-suite reduction approach to improving fault-localization effectiveness[J].Computer Languages,Systems & Structures,2013,39(3):95-108 [10] Jiang Bo,Zhai Ke,Tse T H,et al.On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization[J].Information and Software Technology,2013,5(5):897-917 [11] Yu Kai,Lin Meng-xiang,Gao qing,et al.Locating faults using multiple spectra-specific models[C]∥26th Annual ACM Symposium on Applied Computing (SAC2011).TaiChung,Taiwan,2011:1404-1410 [12] Abreu R,Zoeteweij P,Van Gemund A J C.An evaluation ofsimilarity coefficients for software fault localization[C]∥2nd Pacific Rim International Symposium on Dependable Computing(PRDC2006).2006:39-46 |
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