面向故障定位的基于MC/DC的测试用例约简方法

计算机科学 ›› 2015, Vol. 42 ›› Issue (10): 170-174.

面向故障定位的基于MC/DC的测试用例约简方法

王瑞,田宇立,周东红,李宁,李战怀

西北工业大学计算机学院西安710072;北京信息控制研究所北京100048,西北工业大学计算机学院西安710072,北京信息控制研究所北京100048,西北工业大学计算机学院西安710072,西北工业大学计算机学院西安710072

出版日期:2018-11-14 发布日期:2018-11-14
基金资助:
本文受国家自然科学基金(61402370),中国航天科技集团公司航天科技创新基金(2014H03FK011)资助

Test-suite Reduction Based on MC/DC in Software Fault Localization

WANG Rui, TIAN Yu-li, ZHOU Dong-hong, LI Ning and LI Zhan-huai

Online:2018-11-14 Published:2018-11-14

摘要/Abstract

摘要： 对不断更新的软件进行回归测试时,持续增加的测试用例会造成累计测试用例数量庞大,进而影响测试成本。在故障定位领域,已有研究在考虑语句覆盖、路径覆盖等的基础上,提出了CMR&PVR等不同的测试用例约简方法。然而,这些方法在一定程度上影响了原始测试用例集的MC/DC(修订的条件/判定)覆盖率。提出一种以MC/DC覆盖为基础的综合测试用例约简方法MCDCR,利用该方法对原始测试用例集约简后,在确保原有故障定位准确性并保持较高约简比的同时,大幅提高了测试用例对程序的MC/DC覆盖率。采用Ochiai方法在Siemens 程序集上进行了实验及验证,结果表明MCDCR约简方法的综合效果明显优于已有的约简方法。

关键词: 软件故障定位,测试用例约简,MC/DC覆盖率

Abstract: In the process of software regression testing,frequently modifying software leads to a huge test suite which makes testing more expensive.To address this problem,researches have proposed methods about test suite reduction in consideration of statement/path coverage.However,these methods more or less affect the integrity of MC/DC coverage of the original test suite.We proposed a new approach named MCDCR based on MC/DC coverage rate.Our MCDCR method can guarantee MC/DC coverage while doing no harm to the effectiveness of fault localization and test suite reduction rate.Experiment shows that MCDCR performs better than the existing reduction methods comprehensively.

Key words: Software fault localization,Test-suite reduction,MC/DC coverage

王瑞,田宇立,周东红,李宁,李战怀. 面向故障定位的基于MC/DC的测试用例约简方法[J]. 计算机科学, 2015, 42(10): 170-174. https://doi.org/

WANG Rui, TIAN Yu-li, ZHOU Dong-hong, LI Ning and LI Zhan-huai. Test-suite Reduction Based on MC/DC in Software Fault Localization[J]. Computer Science, 2015, 42(10): 170-174. https://doi.org/

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