Computer Science ›› 2015, Vol. 42 ›› Issue (10): 170-174.

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Test-suite Reduction Based on MC/DC in Software Fault Localization

WANG Rui, TIAN Yu-li, ZHOU Dong-hong, LI Ning and LI Zhan-huai   

  • Online:2018-11-14 Published:2018-11-14

Abstract: In the process of software regression testing,frequently modifying software leads to a huge test suite which makes testing more expensive.To address this problem,researches have proposed methods about test suite reduction in consideration of statement/path coverage.However,these methods more or less affect the integrity of MC/DC coverage of the original test suite.We proposed a new approach named MCDCR based on MC/DC coverage rate.Our MCDCR method can guarantee MC/DC coverage while doing no harm to the effectiveness of fault localization and test suite reduction rate.Experiment shows that MCDCR performs better than the existing reduction methods comprehensively.

Key words: Software fault localization,Test-suite reduction,MC/DC coverage

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