计算机科学 ›› 2014, Vol. 41 ›› Issue (5): 24-26.doi: 10.11896/j.issn.1002-137X.2014.05.005
邢璐,梁华国,严鲁明,张丽娜,余天送
XING Lu,LIANG Hua-guo,YAN Lu-ming,ZHANG Li-na and YU Tian-song
摘要: 随着CMOS集成电路工艺尺寸的不断缩小,电路可靠性问题日益严重,而由NBTI效应引起的电路老化问题尤其突出。由于实际电路大多比较复杂,路径较多,如果对所有路径进行老化预测,工作量会非常大。针对这一实际难题提出了一种基于电路路径中门种类和数目的迭代算法,用来划分和约减电路中不受老化影响电路功能的电路路径。该方法根据路径中每类门的数目和门种类对电路老化的不同影响程度将电路路径进行分类,约减掉不需要预测老化的路径,减少了老化预测的工作量,提高了电路老化预测的效率。
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