Computer Science ›› 2006, Vol. 33 ›› Issue (1): 264-268.
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WANG Wei, YIN Jian-Feng, SUN Zheng Xing （State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing 210093）
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Abstract: In this paper, a fast parametric fitting approach to freehand sketch is presented. This approach fits the freehand sketch with Bézier curves and approximates the curve by error control. It preserves the information of the original sketch as much as possib
Key words: Freehand sketch, Feature point, Fitting, Error contorl
WANG Wei, YIN Jian-Feng, SUN Zheng Xing （State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing 210093）. [J].Computer Science, 2006, 33(1): 264-268.
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