Computer Science ›› 2009, Vol. 36 ›› Issue (5): 133-137.
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ZHU Jing-fen XU Shi yi （School of Computer Engineering and Science, Shanghai University, Shanghai 200072 ,China）
Online:
Published:
Abstract: This paper, based on the random testing,introduced a new eoncept of so called Predetermined Distance Testing （PDDT） for VLSI circuits. Random testing has been employed for years in both software and hardware testing. It is well known that in random testin
Key words: Hamming distance,Cartesian distance,Generation matrix,Predetermined distance
ZHU Jing-fen XU Shi yi （School of Computer Engineering and Science, Shanghai University, Shanghai 200072 ,China）. [J].Computer Science, 2009, 36(5): 133-137.
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