Abstract: Increase of non-uniform power density and high switching frequency has presented new challenges in predicting transient temperature response to fast changing power inputs in highly integrated circuit. This work presented a fast algorithm for predicting temperature evolution of a System on Chip (SoC) or more general semiconductor devices.It utilizes the equivalent thermal RC network for model reductions, and adopts recursive infinite impulse response (IIR)digital filters for accelerated computation in discrete time-domain. The algorithm is validated by comparison to existing convolution integral methods, yielding excellent agreement with several orders of magnitude improvement in computation efficiency. Duc to its simplicity in implementation, the algorithm is very suitable for run-time evaluation of temperature response for dynamic power management applications.

Key words: Dynamic thermal management, Compact thermal model, Dynamic temperature timcdomin response