Abstract: Most existing dynamic instrumentation methods are based on the x86/x64 instruction set,which is poorly compatible with reduced instruction set(RISC) commonly used in embedded devices,and there are problems such as low instrumentation efficiency and large resource consumption when the dynamic instrumentation methods are applied to embedded devices.This paper proposes a dynamic instrumentation method for embedded physical devices(DIEB).DIEB uses control transfer instructions as probes in embedded devices to dynamically perform binary instrumentation on target processes.It proposes a lightweight method to interpret the execution of instructions,and sets the instruction execution area based on the operating environment.DIEB interprets the execution instructions in the simulation execution area to obtain the execution results.During the dynamic operation of the target process,DIEB interprets and executes control transfer instructions to obtain the destination address of the control transfer instructions,and tracks the execution flow of the target process so as to efficiently perform dynamic instrumentation on embedded devices with limited resources.Taking the ARM instruction set as the verification object,experiments are carried out on physical devices such as NetGear R7000.Experimental results show that the DIEB instrumentation process can run normally,and the time delay caused by instrumentation is much smaller than that of the ptrace-based instrumentation method.In addition,DIEB can run stably in a multi-threaded environment and accurately record the execution flow traces of concurrent threads.

Key words: Dynamic binary instrumentation, Instruction interpretation execution, Embedded equipment, Grey box test, Program operation status feedback